Scanning Electron Microscopy (SEM)

High-resolution imaging and elemental analysis for materials characterisation and contamination investigation

Our advanced Electron Microscopy facility provides high-resolution imaging and elemental analysis using Carl Zeiss Scanning Electron Microscopes (SEM) equipped with Bruker Energy Dispersive Spectroscopy (EDS). We support research and industry with detailed characterisation of materials, minerals and complex samples.

Scanning Electron Microscopy (SEM) provides high resolution images of sample topography using secondary electron imaging (SE), as well as highlighting compositional differences using back scattered electron imaging (BSE). Energy Dispersive Spectroscopy (EDS) allows elemental analysis, in addition to imaging, to aid the characterisation of samples. EDS can also be used to perform X-ray mapping, producing elemental maps, which visibly highlight by means of coloured maps, the elemental distribution within a sample. 

These capabilities allow for the analysis of many different sample types, from a variety of industries from engineering to food. SEM/EDS provides valuable information in cases of unknown samples/contaminants, with visualisation of the material producing information on grain size and shape, as well as the associated elemental composition. This can play an important role in cases where unexpected changes have occurred and by performing a comparative analysis between a control and contaminated sample, can highlight the presence of micron sized deposits or damage. SEM/EDS is a non-destructive technique, which can be important where material or component parts are required to be returned or put for additional testing.

Allow the quality equipment and expertise within the Electron Microscopy department at the James Hutton Institute provide detailed, reliable analysis to help optimize processes, enhance quality and problem solve within your industry.

Laura-Jane Strachan, Head of Electron Microscopy

X-ray mapping can also be used in studies into corrosion of various material types, where failure has been caused by chemical and/or physical changes to the material in question.

SEM/EDS is commonly used for Minerology investigations, including the characterisation of rock samples to provide a detailed description of mineral types, grain size and shape, potential origin (detrital or diagenetic), morphology, distribution and their inter-relationships. It is the only technique which allows the visualisation of the minerals present, and therefore plays an important role in characterising these types of samples.  

SEM/EDS is also valuable in the study of scales. Information on the structure and the elemental composition of the particles, or layers in cases of larger scales, obtained by SEM/EDS analysis can provide vital information to customers as to the effectiveness of treatments or plans for further treatments.

Scanning Electron Microscopy (SEM)
Composite Map
Our advanced Electron Microscopy facility provides high-resolution imaging and elemental analysis
Nettle
High-resolution imaging and elemental analysis for materials characterisation and contamination investigation
Delicate clays

What is Scanning Electron Microscopy (SEM)?

Scanning Electron Microscopy (SEM) is an advanced imaging technique used to examine the surface structure and composition of materials at very high magnification. James Hutton Institute Scientific Services uses SEM to produce detailed images and elemental analysis of samples, supporting research across environmental science, geology, agriculture and materials science.

Why is SEM useful for scientific research?

SEM provides highly detailed images that allow researchers to study microscopic features that cannot be seen with standard optical microscopes. James Hutton Institute Scientific Services uses SEM to support investigations into soil structure, mineral composition, biological materials and environmental processes.

Who can benefit from SEM analysis services?

SEM services support researchers, environmental consultants, industry partners and academic institutions. James Hutton Institute Scientific Services provides high-resolution imaging and analysis that helps organisations better understand the structure and composition of complex materials.

Contact for more information

Head of Electron Microscopy
Based in Aberdeen

Laura-Jane Strachan gained a degree in Geology and an honors degree in Geography from the University of Aberdeen. She came to the James Hutton Institute in 2011 with over 5 years experience of working in the oil and gas industry. Her previous experience is in the identification of solid and fluid induced mechanisms causing formation damage, using standard and cryogenic SEM methods and thin section analysis

Laura-Jane currently works in the Electron Microscopy section and predominantly works on commercial projects, using Scanning Electron Microscopy to characterise a range of sample types.